AbstractThe key commonality between all current silicon PUF implementations is their use of parametric manufacturing variations as the source of randomness, which makes stability of the PUF response a major concern. A Locally Enhanced Defectivity Physical Unclonable Function (LEDPUF) is a complete stable PUF implemented by inserting random signal generation units built from hard defective vias. These hard defective vias make LEDPUF resistant to environmental variations because they are permanent and manifested in digital forms. The random signal generation units and several possible mechanisms for random hard defective via generation will be described, such as Direct Self Assembly (DSA), Carbon Nanotube, memristors, and process variation enhancement. |
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